Ersland, Peter : rechercher sur Z-Library

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1

Lifetime acceleration model for HAST tests of a pHEMT process

Peter Ersland, Hei-Ruey Jen, Xinxing Yang

Journal:

Microelectronics Reliability

Année:

2004

Langue:

english

Fichier:

PDF, 542 KB

english, 2004

2

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 94 KB

english, 2009

3

Reliability investigation and characterization of failure modes in Schottky diodes

Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 498 KB

english, 2006

4

Editorial

Ersland, Peter, Menozzi, Roberto

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 176 KB

english, 2014

5

Three individuals, three stories, three burials from medieval Trondheim, Norway

Suppersberger Hamre, Stian, Ersland, Geir Atle, Daux, Valérie, Parson, Walther, Wilkinson, Caroline, Biehl, Peter F.

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 40.16 MB

english, 2017

6

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2004

Langue:

english

Fichier:

PDF, 201 KB

english, 2004

7

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 51 KB

english, 2005

8

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 105 KB

english, 2008

9

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 109 KB

english, 2011

10

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 45 KB

english, 2006

11

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 74 KB

english, 2007

12

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 94 KB

english, 2010

13

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 110 KB

english, 2012

14

No effects of MRI scan on male reproduction hormones

Ole J. Møllerløkken, Bente E. Moen, Valborg Baste, Nils Magerøy, Gunnhild Oftedal, Emanuel Neto, Lars Ersland, Line Bjørge, Peter A. Torjesen, Kjell Hansson Mild

Journal:

Reproductive Toxicology

Année:

2012

Langue:

english

Fichier:

PDF, 501 KB

english, 2012

15

Editorial

Peter Ersland, Roberto Menozzi

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 109 KB

english, 2012

16

Editorial

Ersland, Peter, Menozzi, Roberto

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 150 KB

english, 2014

17

[IEEE [Reliability of Compound Semiconductors] ROCS Workshop 2006 - San Antonio, TX, USA (2006.11.12-2006.11.12)] [Reliability of Compound Semiconductors] ROCS Workshop 2006 - Complete Qualification of an Electron Beam Gate PHEMT Process

Jen, Hei-ruey, Gil, Carlos, Ersland, Peter, Grace Chu, Shiou

Année:

2006

Langue:

english

Fichier:

PDF, 7.91 MB

english, 2006

18

[IEEE 2008 Reliability of Compound Semiconductors Workshop (ROCS) - Monterey, CA, USA (2008.10.12-2008.10.12)] 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] - JEDEC

Ersland, Peter, Mcghee, Ken

Année:

2008

Langue:

english

Fichier:

PDF, 223 KB

english, 2008

19

[IEEE 2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] - Portland, OR, USA (2007.10.14-2007.10.14)] 2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] - ESD Protection Capabilities of GaAs Schottky Diodes

Ersland, Peter, Somisetty, Shivarajiv

Année:

2007

Langue:

english

Fichier:

PDF, 4.15 MB

english, 2007

20

Editorial

Ersland, Peter, Menozzi, Roberto

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 129 KB

english, 2015

21

[IEEE 35th ARFTG Conference Digest - Dallas, TX, USA (1990.05.10-1990.05.11)] 35th ARFTG Conference Digest - On Wafer Pulse Power Vector Testing

Mahon, John, Ersland, Peter, Weichert, Calvin, Lally, Mike, Lanteri, Jean-Pierre, Kaputa, Doug

Année:

1990

Fichier:

PDF, 27 KB

1990

22

Editorial

Ersland, Peter, Menozzi, Roberto

Journal:

Microelectronics Reliability

Année:

2017

Langue:

english

Fichier:

PDF, 128 KB

english, 2017

23

Editorial

Ersland, Peter, Menozzi, Roberto

Journal:

Microelectronics Reliability

Année:

2018

Langue:

english

Fichier:

PDF, 86 KB

english, 2018

24

Demonstrating the potential of CO2 hydrate self-sealing in Svalbard, Arctic Norway

Almenningen, Stian, Betlem, Peter, Hussain, Arif, Roy, Srikumar, Senger, Kim, Ersland, Geir

Journal:

International Journal of Greenhouse Gas Control

Année:

2019

Langue:

english

Fichier:

PDF, 4.77 MB

english, 2019

25

[IEEE 2019 IEEE 2nd Ukraine Conference on Electrical and Computer Engineering (UKRCON) - Lviv, Ukraine (2019.7.2-2019.7.6)] 2019 IEEE 2nd Ukraine Conference on Electrical and Computer Engineering (UKRCON) - Surface Wave Technique at Millimeter Waveband for Semiconductor Testing by Photoexcitation

Vertiy, Alexey, Mizrakhy, Sergey, Uzlenkov, Alexander, Ersland, Peter, Mil'shtein, Sam

Année:

2019

Fichier:

PDF, 3.04 MB

2019